Abstract




 
   

IJE TRANSACTIONS C: Aspects Vol. 30, No. 6 (June 2017) 839-845    Article in Press

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  EMBEDDED MEMORY TEST STRATEGIES AND REPAIR
 
M. Altaf Ahmed, D. Elizabath Rani and S. A. Sattar
 
( Received: July 13, 2016 – Accepted in Revised Form: April 21, 2017 )
 
 

Abstract    The demand of self-testing proportionally increases with memory size in System on Chip (SoC). SoC architecture normally occupies the majority of its area by memories. Due to increase in density of embedded memories, there is a need of self-testing mechanism in SoC design. Therefore, this research study focuses on this problem and introduces a smooth solution for self-testing. In the proposed memory test algorithm, the self-testing as well as self-repair mechanisms are incorporated. This scheme repairs the detected faults and is easily integrated with SoC design. Here, an attempt has been made to implement the memory built-in-self-repair (MBISR) architecture to test and repair the faults from the embedded memories. It is little, and it supports at-fast test without timing penalty during its operation. The proposed method is a better alternative in speed and low area overhead. Thus, it plays a significant role in yield improvement.

 

Keywords    Embedded memory, Self-testing, Memory built-in self-repair (MBISR), System on chip (SoC), Memory test algorithm, yield improvement.

 

چکیده    درخواست برای خودآزمونی با اندازه حافظه در سيستم بر چيپ(SoC) فزونی يافته است. معماریSoC معمولا بخش عمده سطح را با حافظه پر می کند. با توجه به افزايش چگالی حافظه های جاسازی شده، در طراحی SoC نياز به سازوکار خود آزمونی است بنابراين، اين تحقيق بر اين مساله متمرکز بوده ويک حل هموار برای خود آزمونی معرفی می کند. در الگوريتم آزمون حافظه پيشنهادی علاوه بر خود آزمونی، سازوکار بهسازی نيز شرکت دارد. اين شما خطا های پيدا شده را اصلاح کرده و به سادگی با طرح SoC يکپارچه می شود. در اينجا کوشش شده است تا از روی حافظه های جا سازی شده، معماری حافظه built-in-self-repair (MBISR) را برای آزمايش و اصلاح خطا ها پياده سازی کند. اين کار سريع و بدون جريمه زمانی طی عمليات مربوط صورت می گيرد. روش ارائه شده شيوه بهتری از نظر سرعت و با سطح کم می باشد و بنا براين نقش قابل توجهی در بهبود نتيجه دارد.

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